Applied logistic regression /

• Main Author: Hosmer, David W.
• Other Authors: Lemeshow, Stanley
• Format: Book
• Language: English
• Published: New York : John Wiley, [c2000]
• Edition: 2nd ed.
• Series: Wiley series in probability and statistics. Texts and references section
• Subjects: Regression analysis; Ανάλυση παλινδρόμησης; ΟΙΚΟΝΟΜΕΤΡΙΚΑ ΜΟΝΤΕΛΑ