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|a Image processing and pattern recognition in remote sensing II :
|b 8-9 November, 2004, Honolulu, Hawaii, USA /
|c Yoshifumi Yasuoka, Stephen G. Ungar, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NASA--National Aeronautics and Space Administration (USA) ... [et al.].
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|a Bellingham, Wash :
|b SPIE,
|c c2005.
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|a viii, 128 σ. :
|b εικ., χάρτες ;
|c 28 εκ.
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|a SPIE proceedings series
|x 0277-786X ;
|v 5657
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|a Proceedings of SPIE--the International Society for Optical Engineering
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|a Περιλαμβάνει βιβλιογραφικές παραπομπές and ευρετήριο.
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|a Ungar, S. G.
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|a Yasuoka, Yoshifumi
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|a Proceedings of SPIE--the International Society for Optical Engineering
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