Image processing and pattern recognition in remote sensing II : 8-9 November, 2004, Honolulu, Hawaii, USA /

• Other Authors: Ungar, S. G. (επιμελητής.), Yasuoka, Yoshifumi (επιμελητής.)
• Format: Book
• Language: English
• Published: Bellingham, Wash : SPIE, c2005.
• Series: Proceedings of SPIE--the International Society for Optical Engineering 5657; SPIE proceedings series 5657
• Subjects: Γεωεπιστήμες; Τηλεπισκόπηση