APA (7th ed.) Citation

Wang, L., Stroud, C. E., & Touba, N. A. (2008). System-on-chip test architectures: Nanometer design for testability. Morgan Kaufmann Publishers.

Chicago Style (17th ed.) Citation

Wang, Laung-Terng, Charles E. Stroud, and Nur A. Touba. System-on-chip Test Architectures: Nanometer Design for Testability. Amsterdam ; Boston: Morgan Kaufmann Publishers, 2008.

MLA (8th ed.) Citation

Wang, Laung-Terng, et al. System-on-chip Test Architectures: Nanometer Design for Testability. Morgan Kaufmann Publishers, 2008.