Testing semiconductor memories : theory and practice /

Bibliographic Details
Main Author: Goor, A. J. van de (συγγραφέας.)
Format: Book
Language:English
Published: Chichester ; New York : J. Wiley & Sons, 1991.
Subjects:

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 621.381 52 GOO
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