Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /

• Main Author: Bushnell, Michael L. 1950-
• Other Authors: Agrawal, Vishwani D., 1943- (συγγραφέας)
• Format: Book
• Language: English
• Published: Boston ; Dordrecht ; London: Kluwer Academic Publishers, c2000.
• Series: Frontiers in electronic testing
• Subjects: Ηλεκτρονικά κυκλώματα > Τεστ; Ψηφιακά ολοκληρωμένα κυκλώματα