Scanning electron microscopy and X-ray microanalysis a text for biologists, materials scientists, and geologists

Bibliographic Details
Main Author: Goldstein, Joseph I.
Other Authors: Newbury, Dale E., Echlin, Patrick
Format: Book
Language:English
Published: New York Plenum Press 1992
Edition:2nd edition
Subjects:
Description
Physical Description:xviii, 820 p. fig., tab. 27 cm.
Bibliography:Includes bibliographical references and index
ISBN:0306441756