Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale

Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Kalinin, Sergei
Άλλοι συγγραφείς:	Gruverman, Alexei
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	New York, NY Springer Science+Business Media, LLC 2007
Θέματα:	Nanotechnology Surfaces (Physics) Μικροσκόπια Mechanical engineering Particles (Nuclear physics) Chemistry Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Biological Microscopy Mechanical Engineering Solid State Physics and Spectroscopy
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-0-387-28668-6

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