Scanning Microscopy for Nanotechnology Techniques and Applications

Scanning Microscopy for Nanotechnology Techniques and Applications

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Zhou, Weilie
Άλλοι συγγραφείς:	Wang, Zhong Lin
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	New York, NY Springer Science+Business Media, LLC 2007
Θέματα:	Nanotechnology Optical materials Μέτρα και σταθμά Chemistry Characterization and Evaluation of Materials Optical and Electronic Materials Γεωδαισία
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-0-387-39620-0

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