APA (7th ed.) Citation

Egerton, R. F. (2005). Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer Science+Business Media, Inc.

Chicago Style (17th ed.) Citation

Egerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Boston, MA: Springer Science+Business Media, Inc, 2005.

MLA (8th ed.) Citation

Egerton, Ray F. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM. Springer Science+Business Media, Inc, 2005.

Warning: These citations may not always be 100% accurate.