High Dielectric Constant Materials VLSI MOSFET Applications
Κύριος συγγραφέας: | Huff, H.R |
---|---|
Άλλοι συγγραφείς: | Gilmer, D.C |
Μορφή: | Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg
Springer-Verlag Berlin Heidelberg
2005
|
Σειρά: | Springer Series in Advanced Microelectronics
16 |
Θέματα: | |
Διαθέσιμο Online: | http://dx.doi.org/10.1007/b137574 |
Παρόμοια τεκμήρια
-
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1β13 October 2002
ανά: Vilarinho, Paula Maria
Έκδοση: (2005) -
Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20β24 July 2003
ανά: Joyce, Bruce A.
Έκδοση: (2005) -
Springer Handbook of Condensed Matter and Materials Data
ανά: Martienssen, Werner
Έκδοση: (2005) -
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
ανά: Giannuzzi, Lucille A.
Έκδοση: (2005) -
Graded Ferroelectrics, Transpacitors and Transponents
ανά: Mantese, Joseph V.
Έκδοση: (2005)