CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms

CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Li, Flora M.
Άλλοι συγγραφείς:	Nathan, Arokia
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2005
Σειρά:	Microtechnology and Mems
Θέματα:	Optical materials Electronics Engineering Φασματοσκοπική ανάλυση Chemistry Optical and Electronic Materials Electronics and Microelectronics, Instrumentation Physics and Applied Physics in Engineering Φασματομετρική ανάλυση
Διαθέσιμο Online:	http://dx.doi.org/10.1007/b139047

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