CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms

• Main Author: Li, Flora M.
• Other Authors: Nathan, Arokia
• Format: Electronic Kit Book
• Language: English
• Published: Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2005
• Series: Microtechnology and Mems
• Subjects: Optical materials; Electronics; Engineering; Φασματοσκοπική ανάλυση; Chemistry; Optical and Electronic Materials; Electronics and Microelectronics, Instrumentation; Physics and Applied Physics in Engineering; Φασματομετρική ανάλυση