Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11β€“14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11β14, 2005, Oxford, UK

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Cullis, A. G.
Άλλοι συγγραφείς:	Hutchison, J. L.
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2005
Σειρά:	Springer Proceedings in Physics 107
Θέματα:	Materials Electronics Particles (Nuclear physics) Μέτρα και σταθμά Chemistry Materials Science Electronics and Microelectronics, Instrumentation Solid State Physics and Spectroscopy Γεωδαισία
Διαθέσιμο Online:	http://dx.doi.org/10.1007/3-540-31915-8

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