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01297nom a2200361 u 4500 |
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10070939 |
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upatras |
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20210117201632.0 |
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090513s2005 eng |
020 |
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|a 9780387256245
|
040 |
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|a GR-PaULI
|c GR-PaULI
|
041 |
0 |
|
|a eng
|
100 |
1 |
|
|a Larsson, Erik
|9 18777
|
245 |
1 |
0 |
|a Introduction to Advanced System-on-Chip Test Design and Optimization
|h [electronic resource]
|c by Erik Larsson
|
260 |
|
|
|a Boston, MA
|b Springer
|c 2005
|
300 |
|
|
|b v.: digital
|
490 |
0 |
|
|a Frontiers in Electronic Testing
|v 29
|x 0929-1296
|
650 |
|
4 |
|a Engineering
|9 17712
|
650 |
|
4 |
|a Optical materials
|9 64444
|
650 |
|
4 |
|a Computer engineering
|9 24296
|
650 |
|
4 |
|a Electronics
|9 15695
|
650 |
|
4 |
|a Engineering design
|9 64845
|
650 |
|
4 |
|a Engineering
|9 17712
|
650 |
|
4 |
|a Optical and Electronic Materials
|9 64446
|
650 |
|
4 |
|a Electronic and Computer Engineering
|9 64855
|
650 |
|
4 |
|a Electronics and Microelectronics, Instrumentation
|9 64430
|
650 |
|
4 |
|a Engineering Design
|9 64846
|
760 |
1 |
|
|a Frontiers in Electronic Testing
|g 29
|x 0929-1296
|
852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΒΚΠ
|
856 |
4 |
0 |
|u http://dx.doi.org/10.1007/b135763
|
942 |
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|2 ddc
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|0 0
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|d 2016-04-24
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|r 2016-04-24 00:00:00
|w 2016-04-24
|y ERS
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999 |
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|c 47184
|d 47184
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