Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Larsson, Erik
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer 2005
Σειρά:	Frontiers in Electronic Testing 29
Θέματα:	Engineering Optical materials Computer engineering Electronics Engineering design Optical and Electronic Materials Electronic and Computer Engineering Electronics and Microelectronics, Instrumentation Engineering Design
Διαθέσιμο Online:	http://dx.doi.org/10.1007/b135763

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