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01392nom a2200385 u 4500 |
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10070940 |
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upatras |
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20210117201632.0 |
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090513s2005 eng |
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|a 9780387257433
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040 |
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|a GR-PaULI
|c GR-PaULI
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|a eng
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100 |
1 |
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|a Kabisatpathy, Prithviraj
|9 67723
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245 |
1 |
0 |
|a Fault Diagnosis of Analog Integrated Circuits
|h [electronic resource]
|c by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha
|
260 |
|
|
|a Boston, MA
|b Springer
|c 2005
|
300 |
|
|
|b v.: digital
|
490 |
0 |
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|a Frontiers in Electronic Testing
|v 30
|x 0929-1296
|
650 |
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4 |
|a Engineering
|9 17712
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650 |
|
4 |
|a Computer engineering
|9 24296
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650 |
|
4 |
|a Electronics
|9 15695
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650 |
|
4 |
|a Engineering design
|9 64845
|
650 |
|
4 |
|a Systems engineering
|9 64844
|
650 |
|
4 |
|a Engineering
|9 17712
|
650 |
|
4 |
|a Electronic and Computer Engineering
|9 64855
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650 |
|
4 |
|a Electronics and Microelectronics, Instrumentation
|9 64430
|
650 |
|
4 |
|a Engineering Design
|9 64846
|
650 |
|
4 |
|a Circuits and Systems
|9 24301
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700 |
1 |
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|a Barua, Alok
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700 |
1 |
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|a Sinha, Satyabroto
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760 |
1 |
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|a Frontiers in Electronic Testing
|g 30
|x 0929-1296
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852 |
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|a GR-PaULI
|b ΠΑΤΡΑ
|b ΒΚΠ
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856 |
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|u http://dx.doi.org/10.1007/b135977
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|2 ddc
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|a LISP
|b LISP
|d 2016-04-24
|l 0
|r 2016-04-24 00:00:00
|w 2016-04-24
|y ERS
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999 |
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|c 47185
|d 47185
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