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|a Huisman, Leendert M.
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|a Data Mining and Diagnosing IC Fails
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|c by Leendert M. Huisman
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|a Boston, MA
|b Springer Science+Business Media, Inc.
|c 2005
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| 300 |
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|b v.: digital
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|a Frontiers in Electronic Testing
|v 31
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4 |
|a Electronics
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|a Frontiers in Electronic Testing
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