Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails

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Bibliographic Details
Main Author: Huisman, Leendert M.
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer Science+Business Media, Inc. 2005
Series:Frontiers in Electronic Testing 31
Subjects:
Engineering
Electronics
Systems engineering
Electronics and Microelectronics, Instrumentation
Circuits and Systems
Online Access:http://dx.doi.org/10.1007/b137446

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