Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Huisman, Leendert M.
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer Science+Business Media, Inc. 2005
Σειρά:	Frontiers in Electronic Testing 31
Θέματα:	Engineering Electronics Systems engineering Electronics and Microelectronics, Instrumentation Circuits and Systems
Διαθέσιμο Online:	http://dx.doi.org/10.1007/b137446

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