Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Sikula, Josef
Άλλοι συγγραφείς:	Levinshtein, Michael
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Dordrecht Springer Science + Business Media, Inc. 2005
Σειρά:	NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry 151
Θέματα:	Physics Optical materials Computer engineering Μέτρα και σταθμά Optical and Electronic Materials Electronic and Computer Engineering Γεωδαισία
Διαθέσιμο Online:	http://dx.doi.org/10.1007/1-4020-2170-4

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