Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1β€“13 October 2002

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1β13 October 2002

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Vilarinho, Paula Maria
Άλλοι συγγραφείς:	Rosenwaks, Yossi, Kingon, Angus
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Dordrecht Kluwer Academic Publishers 2005
Σειρά:	NATO Science Series II: Mathematics, Physics and Chemistry 186
Θέματα:	Physics Optical materials Nanotechnology Surfaces (Physics) Condensed matter Optical and Electronic Materials Surfaces and Interfaces, Thin Films Condensed Matter
Διαθέσιμο Online:	http://dx.doi.org/10.1007/1-4020-3019-3

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