Παραπομπή σε μορφή APA (7η εκδ.)

Rein, S. (2005). Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Springer-Verlag Berlin Heidelberg.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2005.

Παραπομπή σε μορφή MLA (8th εκδ.)

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Springer-Verlag Berlin Heidelberg, 2005.