Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications

Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Rein, Stefan
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2005
Σειρά:	Springer Series in Material Science 85
Θέματα:	Physics Optical materials Particles (Nuclear physics) Optical and Electronic Materials Solid State Physics and Spectroscopy
Διαθέσιμο Online:	http://dx.doi.org/10.1007/3-540-27922-9

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