Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications

• Main Author: Rein, Stefan
• Format: Electronic Kit Book
• Language: English
• Published: Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2005
• Series: Springer Series in Material Science 85
• Subjects: Physics; Optical materials; Particles (Nuclear physics); Optical and Electronic Materials; Solid State Physics and Spectroscopy