Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices

Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Gusev, Evgeni
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Dordrecht Springer 2006
Σειρά:	NATO Science Series II: Mathematics, Physics and Chemistry 220
Θέματα:	Engineering Computer engineering Electronics Condensed matter Electronic and Computer Engineering Electronics and Microelectronics, Instrumentation Physics and Applied Physics in Engineering Condensed Matter
Διαθέσιμο Online:	http://dx.doi.org/10.1007/1-4020-4367-8

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