Waveguide spectroscopy of thin films
In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in t...
| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | Electronic Book |
| Language: | English |
| Published: |
Amsterdam
Elsevier
2005
|
| Edition: | 1st ed |
| Series: | Thin films and nanostructures
v. 33 |
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click for information An electronic book accessible through the World Wide Web; click for information |
| Summary: | In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated |
|---|---|
| Physical Description: | xv, 220 σ. εικ. 24 εκ |
| Bibliography: | Περιέχει βιβλιογραφικές παραπομπές (σ. 207-217) and index |
| ISBN: | 9780120885152 0120885158 |
