Know the risk learning from errors and accidents : safety and risk in today's technology

We live in a technological world, exposed to many risks and errors and the fear of death. Know the Risk shows us how we can learn from the many errors and tragic accidents which have plagued our developing technological world. This breakthrough volume presents a new concept and theory that shows how...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Duffey, R. B ((Romney B.))
Συγγραφή απο Οργανισμό/Αρχή: ScienceDirect (Online service)
Άλλοι συγγραφείς: Saull, John Walton 1935-
Μορφή: Ηλεκτρονική πηγή Βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam Boston Butterworth-Heinemann c2003
Θέματα:
Διαθέσιμο Online:An electronic book accessible through the World Wide Web; click for information
An electronic book accessible through the World Wide Web; click for information
Publisher description
Table of contents
LEADER 04317nam a2200373 u 4500
001 10074934
003 upatras
005 20210831110505.0
008 090520s2003 eng
020 |a 9780750675963 
020 |a 0750675969 
040 |a GR-PaULI  |c GR-PaULI 
041 0 |a eng 
050 4 |a T55  |b .D815 2003eb 
082 1 4 |a 620.8/6  |2 22 
100 1 |a Duffey, R. B  |q ((Romney B.))  |9 74635 
245 1 0 |a Know the risk  |h [electronic resource]  |b learning from errors and accidents : safety and risk in today's technology  |c Romney Beecher Duffey, John Walton Saull 
260 |a Amsterdam  |a Boston  |b Butterworth-Heinemann  |c c2003 
300 |a xiv, 227 σ.  |b εικ. (some col.)  |c 24 εκ 
504 |a Περιέχει βιβλιογραφικές παραπομπές (σ. 201-210) and index 
505 1 |a Measuring safety; Traveling in Safety; Working in safety; Living in safety; Error Management: Strategies for Reducing Risk; Universal Learning Curves and the Exponential Model for Errors, Incidents and Accidents; Extracts from Event Investigations and Inquiries 
505 1 |a Measuring Safety -- Traveling in Safety -- Working in Safety -- Living in Safety -- Error Management: Strategies for Reducing Risk 
520 |a We live in a technological world, exposed to many risks and errors and the fear of death. Know the Risk shows us how we can learn from the many errors and tragic accidents which have plagued our developing technological world. This breakthrough volume presents a new concept and theory that shows how errors can and should be analyzed so that learning and experience are accounted for. The authors show that, by using a universal learning curve, errors can be tracked and managed so that they are reduced to the smallest number possible. The authors have devoted a number of years to gathering data, analyzing theories relating to error reduction, design improvement, management of errors and assignment of cause. The analyzed data relates to millions of errors. They find a common thread between all technology-related accidents and link all of these errors (from the headline stories to the everyday accidents). They challenge the reader to take a different look at the stream of threats, risks, dangers, statistics and errors by presenting a new perspective. The book makes use of detailed illustrations and explores many headline accidents which highlight human weaknesses in harnessing and exploiting the technology we have developed; from the Titanic to Chernobyl, Bhopal to Concorde, the Mary Rose to the Paddington rail crash and examine errors over which we have little or no control. By analyzing the vast data society has collected, the authors show how the famous accidents and our everyday risks are related. The authors prove the strength of their observations by comparing their findings to the recorded history of tragedies, disasters, accidents and incidents in chemical, airline, shipping, rail, automobile, nuclear, medical, industrial and manufacturing technologies. They also address the management of Quality and losses in production, the search for zero defects and the avoidance of personal risk and danger. Stresses the importance of a learning environment for safety improvement Places both quality and safety management in the same learning context Learn how to track and manage errors to reduce as quickly as possible 
650 4 |a Βιομηχανική ασφάλεια  |9 74623 
700 1 |a Saull, John Walton  |d 1935-  |9 74636 
710 2 |a ScienceDirect (Online service)  |9 35187 
852 |a GR-PaULI  |b ΠΑΤΡΑ  |b ΒΚΠ  |h 620.8/6 DUF 
856 4 0 |3 ScienceDirect  |u http://www.sciencedirect.com/science/book/9780750675963  |z An electronic book accessible through the World Wide Web; click for information 
856 4 0 |3 Referex  |u http://www.engineeringvillage.com/controller/servlet/OpenURL?genre=book&isbn=9780750675963  |z An electronic book accessible through the World Wide Web; click for information 
856 4 2 |3 Publisher description  |u http://www.loc.gov/catdir/description/els051/2002026289.html 
856 4 1 |3 Table of contents  |u http://www.loc.gov/catdir/toc/fy034/2002026289.html 
942 |2 ddc 
999 |c 50801  |d 50801 
952 |0 0  |1 0  |4 0  |6 620_800000000000000_6_DUF  |7 0  |9 76033  |a LISP  |b LISP  |d 2016-04-24  |l 0  |o 620.8/6 DUF  |r 2016-04-24  |w 2016-04-24  |y ERS