Instrumentation and measurement technology and applications

Bibliographic Details
Other Authors: Petriu, Emil (Editor)
Format: Book
Language:English
Published: New York Institute of Electrical and Electronics Engineers 1998
Series:IEEE technology update series
Subjects:
Description
Item Description:A collection of selected papers from recent IEEE conferences
Physical Description:xx, 521 p. fig., tab., phot. 29 cm.
Bibliography:Includes bibliographical references and index
ISBN:0780342682