Παραπομπή σε μορφή APA (7η εκδ.)

Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., & Virazel, A. (2010). Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (1.). Springer-Verlag US.

Παραπομπή σε μορφή Chicago (17η εκδ.)

Bosio, Alberto, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, και Arnaud Virazel. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Boston, MA: Springer-Verlag US, 2010.

Παραπομπή σε μορφή MLA (8th εκδ.)

Bosio, Alberto, et al. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Springer-Verlag US, 2010.