APA (7th ed.) Citation

Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., & Virazel, A. (2010). Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (1.). Springer-Verlag US.

Chicago Style (17th ed.) Citation

Bosio, Alberto, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, and Arnaud Virazel. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Boston, MA: Springer-Verlag US, 2010.

MLA (8th ed.) Citation

Bosio, Alberto, et al. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1. Springer-Verlag US, 2010.