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10090323 |
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upatras |
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20210117202813.0 |
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110802s2010 eng |
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|a 9781441909381
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|a GR-PaULI
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|a eng
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| 100 |
1 |
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|a Bosio, Alberto
|9 93591
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| 245 |
1 |
0 |
|a Advanced Test Methods for SRAMs
|h [electronic resource]
|b Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
|c by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
|
| 250 |
|
|
|a 1
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| 260 |
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|a Boston, MA
|b Springer-Verlag US
|c 2010
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| 300 |
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|b v.: digital
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| 650 |
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4 |
|a Engineering
|9 17712
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| 650 |
|
4 |
|a Computer aided design
|9 24299
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| 650 |
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|a Systems engineering
|9 64844
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| 650 |
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4 |
|a Engineering
|9 17712
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| 650 |
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4 |
|a Circuits and Systems
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| 650 |
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4 |
|a Computer-Aided Engineering (CAD, CAE) and Design
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| 700 |
1 |
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|a Dilillo, Luigi
|9 93592
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|a Girard, Patrick
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| 700 |
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|a Pravossoudovitch, Serge
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1 |
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|a Virazel, Arnaud
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|a SpringerLink (Online service)
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|u http://dx.doi.org/10.1007/978-1-4419-0938-1
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