Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Bosio, Alberto
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer-Verlag US 2010
Έκδοση:	1
Θέματα:	Engineering Computer aided design Systems engineering Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-1-4419-0938-1

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