Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Show other versions (1)
Bibliographic Details
Main Author: Bosio, Alberto
Corporate Author: SpringerLink (Online service)
Other Authors: Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer-Verlag US 2010
Edition:1
Subjects:
Engineering
Computer aided design
Systems engineering
Circuits and Systems
Computer-Aided Engineering (CAD, CAE) and Design
Online Access:http://dx.doi.org/10.1007/978-1-4419-0938-1

Similar Items

Similar Items