Advanced Computing in Electron Microscopy

Advanced Computing in Electron Microscopy

Εμφάνιση άλλων εκδόσεων (1)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Kirkland, Earl J
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer Science+Business Media, LLC 2010
Θέματα:	Computer engineering Surfaces (Physics) Materials Science Characterization and Evaluation of Materials Electrical Engineering
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-1-4419-6533-2

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