Advanced Computing in Electron Microscopy

Advanced Computing in Electron Microscopy

Show other versions (1)
Bibliographic Details
Main Author: Kirkland, Earl J
Corporate Author: SpringerLink (Online service)
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer Science+Business Media, LLC 2010
Subjects:
Computer engineering
Surfaces (Physics)
Materials Science
Characterization and Evaluation of Materials
Electrical Engineering
Online Access:http://dx.doi.org/10.1007/978-1-4419-6533-2

Similar Items

Similar Items