New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Shimizu, Kenichi
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Mitani, Tomoaki
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2010
Σειρά:	Springer Series in Surface Sciences 45
Θέματα:	Engineering Nanotechnology Surfaces (Physics) Materials Science Surfaces and Interfaces, Thin Films Γεωδαισία Solid State Physics Φασματοσκοπία Νανοτεχνολογία
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-3-642-03160-1

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