Goesele, M., Roth, S., Kuijper, A., Schiele, B., & Schindler, K. (2010). Pattern Recognition: 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Springer-Verlag Berlin Heidelberg.
Chicago Style (17th ed.) CitationGoesele, Michael, Stefan Roth, Arjan Kuijper, Bernt Schiele, and Konrad Schindler. Pattern Recognition: 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2010.
MLA (8th ed.) CitationGoesele, Michael, et al. Pattern Recognition: 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Springer-Verlag Berlin Heidelberg, 2010.
Warning: These citations may not always be 100% accurate.