Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strategies for Low Power Devices

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Girard, Patrick
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Άλλοι συγγραφείς:	Nicolici, Nicola, Wen, Xiaoqing
Μορφή:	Ηλεκτρονική πηγή Εργαλειοθήκη Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA Springer-Verlag US 2010
Θέματα:	Engineering Computer aided design Systems engineering Circuits and Systems Computer-Aided Engineering (CAD, CAE) and Design
Διαθέσιμο Online:	http://dx.doi.org/10.1007/978-1-4419-0928-2

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