Breitenstein, O., Warta, W., & Langenkamp, M. (2010). Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. Springer-Verlag Berlin Heidelberg.
Chicago Style (17th ed.) CitationBreitenstein, Otwin, Wilhelm Warta, and Martin Langenkamp. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2010.
MLA (8th ed.) CitationBreitenstein, Otwin, et al. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. Springer-Verlag Berlin Heidelberg, 2010.
Warning: These citations may not always be 100% accurate.
