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LEADER |
01472nom a2200385 u 4500 |
001 |
10093640 |
003 |
upatras |
005 |
20210422092523.0 |
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110802s2010 eng |
020 |
|
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|a 9783642024177
|
040 |
|
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|a GR-PaULI
|c GR-PaULI
|
041 |
0 |
|
|a eng
|
100 |
1 |
|
|a Breitenstein, Otwin
|9 99998
|
245 |
1 |
0 |
|a Lock-in Thermography
|h [electronic resource]
|b Basics and Use for Evaluating Electronic Devices and Materials
|c by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp
|
260 |
|
|
|a Berlin, Heidelberg
|b Springer-Verlag Berlin Heidelberg
|c 2010
|
300 |
|
|
|b v.: digital
|
490 |
0 |
|
|a Springer Series in Advanced Microelectronics
|v 10
|x 1437-0387
|
650 |
|
4 |
|a Physics
|9 20895
|
650 |
|
4 |
|a Engineering
|9 17712
|
650 |
|
4 |
|a Materials
|9 13218
|
650 |
|
4 |
|a Surfaces (Physics)
|9 64420
|
650 |
|
4 |
|a Physics
|9 20895
|
650 |
|
4 |
|a Οπτική
|9 353
|
650 |
|
4 |
|a Characterization and Evaluation of Materials
|9 64421
|
650 |
|
4 |
|a Engineering, general
|9 64337
|
650 |
|
4 |
|a Δομική μηχανική
|9 64858
|
700 |
1 |
|
|a Warta, Wilhelm
|9 99999
|
700 |
1 |
|
|a Langenkamp, Martin
|9 100000
|
710 |
2 |
|
|a SpringerLink (Online service)
|9 68735
|
760 |
1 |
|
|a Springer Series in Advanced Microelectronics
|g 10
|x 1437-0387
|
852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΒΚΠ
|
856 |
4 |
0 |
|u http://dx.doi.org/10.1007/978-3-642-02417-7
|
942 |
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|2 ddc
|
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|d 2016-04-24
|l 0
|r 2016-04-24 00:00:00
|w 2016-04-24
|y ERS
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999 |
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|c 69340
|d 69340
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