Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials
| Main Author: | |
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| Corporate Author: | |
| Other Authors: | , |
| Format: | Electronic Kit Book |
| Language: | English |
| Published: |
Berlin, Heidelberg
Springer-Verlag Berlin Heidelberg
2010
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| Series: | Springer Series in Advanced Microelectronics
10 |
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1007/978-3-642-02417-7 |
