Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials

• Main Author: Breitenstein, Otwin
• Corporate Author: SpringerLink (Online service)
• Other Authors: Warta, Wilhelm, Langenkamp, Martin
• Format: Electronic Kit Book
• Language: English
• Published: Berlin, Heidelberg Springer-Verlag Berlin Heidelberg 2010
• Series: Springer Series in Advanced Microelectronics 10
• Subjects: Physics; Engineering; Materials; Surfaces (Physics); Οπτική; Characterization and Evaluation of Materials; Engineering, general; Δομική μηχανική