Quantifying and Exploring the Gap Between FPGAs and ASICs Measuring and Exploring

Bibliographic Details
Main Author: Kuon, Ian
Corporate Author: SpringerLink (Online service)
Other Authors: Rose, Jonathan
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer Science+Business Media, LLC 2010
Subjects:
Online Access:http://dx.doi.org/10.1007/978-1-4419-0739-4

Internet

http://dx.doi.org/10.1007/978-1-4419-0739-4

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