Extreme Statistics in Nanoscale Memory Design

Extreme Statistics in Nanoscale Memory Design

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Bibliographic Details
Main Author: Singhee, Amith
Corporate Author: SpringerLink (Online service)
Other Authors: Rutenbar, Rob A
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer Science+Business Media LLC 2010
Edition:1
Series:Integrated Circuits and Systems
Subjects:
Engineering
Electronics
Systems engineering
Circuits and Systems
Electronics and Microelectronics, Instrumentation
Online Access:http://dx.doi.org/10.1007/978-1-4419-6606-3

Internet

http://dx.doi.org/10.1007/978-1-4419-6606-3

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