Material characterization using ion beams /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
New York :
Plenum Press,
1978.
|
| Series: | NATO ASI series. Physics
28. |
| Subjects: |
ΒΚΠ - Πατρα: Reference Shelf
| Call Number: |
Π/Σ 530.416 NAT |
|---|---|
| Copy 1 | Available |
