Material characterization using ion beams /
| Corporate Author: | NATO Advanced Study Institute on Material Characterization Using Ion Beams Aleria, France |
|---|---|
| Other Authors: | Cachard, A. (επιμελητής.), Thomas, Jean-Paul, 1944- (επιμελητής.) |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
New York :
Plenum Press,
1978.
|
| Series: | NATO ASI series. Physics
28. |
| Subjects: |
Similar Items
-
Site characterization and aggregation of implanted atoms in materials /
Published: (1980) -
The ion channel factsbook /
by: Conley, Edward C.
Published: (1996) -
Electron and ion spectroscopy of solids /
Published: (1978) -
Interaction between ions and molecules /
Published: (1975) -
Ligand- and voltage-gated ion channels /
Published: (1995)