Material characterization using ion beams /
Corporate Author: | |
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Other Authors: | , |
Format: | Conference Proceeding Book |
Language: | English |
Published: |
New York :
Plenum Press,
1978.
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Series: | NATO ASI series. Physics
28. |
Subjects: |
ΒΚΠ - Πατρα: Reference Shelf
Call Number: |
Π/Σ 530.416 NAT |
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Copy 1 | Available |