Testing and reliable design of CMOS circuits /

Bibliographic Details
Main Author: Jha, Niraj K. (συγγραφέας)
Other Authors: Kundu, Sandip (συγγραφέας)
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, 1990.
Series:The Kluwer international series in engineering and computer science SECS 88
Subjects:
Description
Physical Description:xii, 231 σ. : εικ. ; 24 εκ.
Bibliography:Περιλαμβάνει βιβλιογραφικές παραπομπές.