Testing and reliable design of CMOS circuits /

Bibliographic Details
Main Author: Jha, Niraj K. (συγγραφέας)
Other Authors: Kundu, Sandip (συγγραφέας)
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, 1990.
Series:The Kluwer international series in engineering and computer science SECS 88
Subjects:

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 621.397 32 JHA
Copy 1 Available

ΒΚΠ - Πατρα: ALFe

Holdings details from ΒΚΠ - Πατρα: ALFe
Call Number: 621.397 32 JHA
Copy 1 Available