Random fluctuations and pattern growth: experiments and models

• Other Authors: Ostrowsky, Nicole (Editor), Stanley, H. E. (Editor)
• Format: Book
• Language: English
• Published: Dordrecht Kluwer Academic Publishers c1988
• Series: NATO ASI Series 157
• Subjects: COMPUTER SYSTEMS; Ηλεκτρονικοί υπολογιστές > Συστήματα; ΜΝΗΜΗ RAM