Logic Testing and Design for Testability

• Main Author: Fujiwara, Hideo (Author)
• Format: Book
• Language: English
• Published: Cambridge Mass. Massachusetts Institute of Technology Cambridge Mass. c1985
• Series: MIT Press Series in Computer Systems
• Subjects: INTEGRATED CIRCUITS; VLSI
• Item Description: Βιβλιογραφία: σσ.272-278
• Physical Description: x, 284p. fig.
• ISBN: 0 262 06096 5